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Maybe the error rate of massively parralel e-beam could be good enough for ML chips?



I don't think being an ML chip means the defects are necessarily less fatal. These often interfere with the actual functioning of the chip, cause shorts, etc -- it's not just a matter of the TTL being very slightly messed up somewhere.

You could imagine chips that are engineered for redundancy / defect resistance, but that would make them a lot less performant so it's highly questionable whether that can be justified by any cost savings on litho.




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